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November 18, 2005ChemPhysChem

Inherent Complexities of Trace Detection by Surface‐Enhanced Raman Scattering

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Authors

NPNicholas P. W. PieczonkaGeneral Motors (United States)RARicardo F. ArocaUniversidad de Valladolid

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Pieczonka et al. (2005) studied this question.

synapsesocial.com/papers/6a211afa0236525c0302b341https://doi.org/10.1002/cphc.200500112
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