The authors describe a 14-ns 1-Mb CMOS SRAM (static random-access memory) with both 1M word*1-b and 256 K word*4-b organizations. The desired organization is selected by forcing the state of an external pin. The fast access time is achieved by the use of a shorter divided-word-line (DWL) structure, a highly sensitive sense amplifier, a gate-controlled data-bus driver, and a dual-level precharging technique. The 0.7- mu m double-aluminum and triple-polysilicon process technology with trench isolation offers a memory cell size of 41.6 mu m/sup 2/ and a chip size of 86.6 mm/sup 2/. The variable bit-organization function reduces the testing time while keeping the measurement accuracy of the access times.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
No takes yet. Share an insight, caveat, or question.
Kohno et al. (1988) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context:
More from IEEE Journal of Solid-State Circuits