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July 1, 2012

Scaling Effects in Highly Scaled Commercial Nonvolatile Flash Memories

Farokh Irom Duc N. Nguyen Gregory R. Allen Stephanie Zajac

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Abstract

SEE measurements and TID response for 25 nm Micron Technology NAND flash memories are reported. Radiation results of MLC 64 Gb parts are compared with results from SLC 32 Gb parts. Also, scaling effects on SEE and TID are discussed.

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Irom et al. (2012) studied this question.

synapsesocial.com/papers/6a21bf8a0bd5b57e54e36254 https://doi.org/10.1109/redw.2012.6353720

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