Optimizing the Nion STEM for In-Situ Experiments

Designers of electron microscopes are often pulled in two directions: a) maximizing the performance, such as the microscope's spatial resolution, energy resolution, beam current, and stability, b) maximizing the flexibility, i.e. the microscope's ability to perform a variety of experiments beyond imaging and diffraction, such as in-situ/operando microscopies, and various spectroscopies.