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March 1, 1975Journal of Applied PhysicsOpen Access

Mechanism of electrical breakdown in SiO2 films

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BRB. K. RidleyUniversity of Essex

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B. K. Ridley (1975) studied this question.

synapsesocial.com/papers/6a2227fbf833e2d5e8580086https://doi.org/10.1063/1.321721
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