Slide-Aware Deep Feature Prompting for Enhanced Whole Slide Image Classification

The advent of Whole Slide Imaging (WSI) has revolutionised digital pathology by enabling computational analysis of gigapixel-scale images. To handle their large size, most deep learning models divide WSIs into patches and apply Multiple Instance Learning (MIL) for slide-level classification. However, MIL models often depend on pre-trained feature extractors, resulting in domain gaps between natural and pathological images. Parameter-Efficient Fine-Tuning (PEFT) via visual prompting has emerged to bridge this gap with minimal overhead. Nevertheless, existing visual prompts are typically attached at the image level and tightly coupled with specific architectures such as CNNs or ViTs, limiting generalisability and scalability in WSI tasks. To overcome these limitations, we propose Slide-aware Deep Feature Prompt (S-DFP), a novel visual prompting method which derives task-specific information directly from feature embeddings and is initialised with slide-specific cues, thereby enhancing compatibility with diverse feature extractors and MIL frameworks. Experiments on four benchmark datasets, CAMELYON16, BRIGHT, TCGA-IDH, and UniToPath, demonstrate that S-DFP consistently boosts MIL model performance by 2–5% in AUC while introducing less than 0.02% additional parameters. Furthermore, when integrated with recent pathology foundation models, S-DFP yields additional performance gains. The code is publicly available at S-DFP .