Demonstrates high polarization sensitivity in a dual-channel photodetector, indicating its potential for advanced imaging systems.
Polarization-sensitive photodetectors enable the decoding of light polarization states, thereby improving target contrast and revealing subtle surface structural details in complex imaging scenarios. However, achieving high polarization ratios over a broad spectral range remains a key challenge. In this work, we demonstrate a van der Waals (vdW) heterostructure polarization photodetector based on two-dimensional (2D) materials ReS2 and 2H-MoTe2. Benefiting from the in-plane anisotropic crystal structure and synergistic effects of the interfacial field, the device presents excellent polarization-sensitive photoresponse, spanning broadband from 532 to 1064 nm. Specifically, it can achieve a polarization ratio (PR) of 8.1 and significantly low noise equivalent polarization difference of 0.0001° Hz–1/2, highlighting its strong potential for high-precision polarization detection. Meanwhile, high responsivity (R) and specific detectivity (D*) of up to 58.5 A/W and 0.6 × 1012 Jones are attained, respectively. Proof-of-concept validations via broadband polarization imaging and dual-channel optical communication further reveal its operational versatility. This work paves a promising pathway for developing next-generation polarization-encoded imaging systems and multidimensional optoelectronic information processors based on 2D anisotropic heterostructures.
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Zhang et al. (2026) studied this question.
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