The index of refraction of cesium bromide was measured at 37 wavelengths from 0.365 t o 39.22 microns. Th e minimum deviation method was used , and the entire range was covered with a single instrument. The index changes approximately two units in the first d ecimal place over the wavelength range. The dispers ion compares favorably with that of I{RS-5 beyond 20 microns; and when the effects of inhomogeneity and reflection losses are conSidered, the r esolving power of esBr is probably better.
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Rodney et al. (1953) studied this question.