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The method presented here aims at determining the complex permeability /spl mu/* and permittivity of /spl epsiv/* with an automatic and broad band (45 MHz-18 GHz) system from the reflection-transmission measurement of the S-parameters of a microstrip test device. The complex values /spl epsiv/* and /spl mu/* are obtained with the S-parameters from a specific software created within the context of this work. Compared with previous methods, our measurement technique is fast, easy to implement and does not require any calibration test sample or pick-up coils. Lastly, an analysis of the error depending on the method used and the results found with bulk isotropic materials (dielectrics and ferrites) are presented.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Quéffélec et al. (1994) studied this question.
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