The state of Bi at the grain boundaries of ZnO varistors was analyzed using FE‐TEM with EDS point and mapping analysis with a spatial resolution of less than 1 nm. The continuous existence of Bi of less than 1/2 atomic layer has been confirmed at ZnO‐ZnO junctions without any secondary phase. The coexistence of a crystalline Bi 2 O 3 and an amorphous phase has been found, and a new model has been proposed for the transition of the Bi‐O phase from crystalline Bi 2 O 3 to atomic Bi via an amorphous phase with decreasing thickness of grain boundary phases.
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Kobayashi et al. (1998) studied this question.
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