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This paper proposes a simulation-based modeling methodology that provides greater flexibility in the design and layout of millimeter-wave CMOS circuits than measurement- based models do. A physical model for the metallization capacitances of the transistors is described and new layout techniques are introduced that exploit these capacitances to improve the circuit performance. The accuracy of the models is verified by the design and measurement of five oscillators operating in the range of 40 GHz to 130 GHz in 90-nm CMOS technology.
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Liang et al. (2009) studied this question.
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