Terahertz Dielectric Characterization and Hybrid Debye–Lorentz Modeling of Silicone Rubber Composites for Composite Insulators

High-temperature vulcanized (HTV) silicone rubber serves as the core material for composite insulators, and its high-frequency dielectric properties directly dictate its macroscopic insulation performance. However, traditional electrical detection methods encounter a “high-frequency blind zone” above the gigahertz (GHz) range due to limited precision and ambiguous physical mechanisms. In this study, terahertz time-domain spectroscopy (THz-TDS) was employed to characterize the complex permittivity spectra of silicone rubber specimens, incorporated with varying ratios of alumina trihydrate (ATH) and silica (SiO2) fillers, across the 0.1–3.0 THz frequency range. Experimental results reveal that the terahertz dielectric characteristics of silicone rubber exhibit a pronounced filler dependency: as the ATH content increases from 95 phr to 185 phr, the real part of the permittivity at 1 THz increases by 32%. Notably, all specimens manifest a sharp dielectric transition near 1.2 THz, characterized by distinct dual absorption peaks in the imaginary permittivity spectra. To characterize this non-linear transition, a hybrid Debye–Lorentz model is innovatively introduced. This approach overcomes the inherent limitations of traditional double Debye models, which are restricted to relaxation processes and fail to account for high-frequency resonance. Fitting results and physical analysis demonstrate that the response at 1.2 THz is primarily attributed to the bending vibrations of Si-O-Si bonds in the polymer backbone, alongside the collective vibration modes of Al-O bonds and the hydrogen-bonded network within the fillers. The hybrid model successfully decouples three distinct polarization mechanisms: conduction loss (<0.5 THz), dipole relaxation (0.5–1.0 THz), and lattice resonance (>1.0 THz). This work provides a robust characterization framework for the quantitative evaluation of the high-frequency dielectric response and microstructural integrity of composite insulators.