Effect of Relatively Low Solution Temperature on the Growth Dynamics of PbSe Thin Films Synthesized by Chemical Bath Deposition

This study presents the successful fabrication of PbSe thin films utilizing the chemical bath deposition technique. This study examines the impacts of comparatively low solution temperatures. X-ray diffraction (XRD) patterns show that the obtained films have a cubic crystal structure. SEM examinations were carried out at 10 kx and 30 kx magnifications to examine the surface morphology of the films. SEM images revealed that the film surfaces were free from holes, voids, and cracks. Surface roughness values were determined using ImageJ software. It was observed that films deposited at solution temperatures lower than 20°C exhibited relatively lower surface roughness values. The photographs confirmed that the produced films adhered effectively to the glass substrate surface.