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Investigates performance of p-n diodes with polarization doping in electronic devices, suggesting optimization potential.
An analytical model for AlGaN-based distributed polarization doping (DPD) p–n diodes is developed, integrating temperature-dependent lifetimes and thermionic-field emission effects. Validated against experimental data from Kumabe et al., IEEE Trans. Electron Devices 71, 3396 (2024), the model captures the conduction transition from Shockley–Read–Hall-recombination-dominated to drift-dominated transport at the moderate temperature. We quantitatively define the depletion approximation's validity and demonstrate the DPD structure's capability to decouple carrier mobility from injection efficiency. This framework provides a rigorous foundation for optimizing polarization-engineered wide-bandgap power electronics across a wide temperature range.
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Lio et al. (2026) studied this question.
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