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Demonstrates improved waveguide properties in bulk silicon, indicating enhanced optical performance.
We demonstrate effective control of the shape and depth of sub-wavelength sized modifications in bulk silicon inscribed by transverse ultrafast single-shot laser pulses of 5 ps at 2.09 μm. A balance of multi-photon absorption and Kerr effect makes it possible to create the modifications with dimensions as small as 0.7 μm × 1.1 μm in the wide range of sub-surface depths. This approach was used for inscription of 9.8-mm long depressed cladding waveguides as a most common 3D structure. Waveguide properties were analyzed at 1.55 μm. The lowest propagation losses and the highest negative refractive index contrast were measured to be 1.8 dB/cm and 2.1 × 10 −3 respectively.
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Demesh et al. (2026) studied this question.
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