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October 15, 1971Applied Physics Letters

Barrier Inhomogeneities on a Si–SiO2 Interface by Scanning Internal Photoemission

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TDT. H. DiStefanoIBM Research - Thomas J. Watson Research Center

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T. H. DiStefano (1971) studied this question.

synapsesocial.com/papers/6a5db60dbcb839ae37c5acd7https://doi.org/10.1063/1.1653918
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  5. 5Photoinjection into SiO2: Use of Optical Interference to Determine Electron and Hole Contributions1969 · 107 citations