YOLO-SDL: a lightweight wheat grain detection technology based on an improved YOLOv8n model

Wheat, being a crucial global food crop, holds immense significance for food safety and agricultural economic stability, as the quality and condition of its grains are critical factors. Traditional methods of wheat grain detection are inefficient, and the advancements in deep learning offer a novel solution for fast and accurate grain recognition. This study proposes an improved deep learning model based on YOLOv8n, referred to as YOLO-SDL, aiming to achieve efficient wheat grain detection. A high-quality wheat grain dataset was first constructed, including images of perfect, germinated, diseased, and damaged grains. Multiple data augmentation techniques were employed to enhance the dataset's complexity and diversity. The YOLO-SDL model incorporates the ShuffleNetV2 architecture in its backbone and combines depthwise separable convolutions (DWConv) with the large separable kernel attention (LSKA) mechanism in its neck structure, significantly improving detection speed and accuracy while ensuring the model remains lightweight. The results indicate that YOLO-SDL achieves superior performance in wheat grain detection, balancing lightweight design and performance optimization. The model achieved a P of 0.942, R of 0.903, mAP50 of 0.965, and mAP50-95 of 0.859, with low computational complexity, making it suitable for resource-constrained environments. These findings demonstrate the efficiency of the ShuffleNetV2, DWConv, and LSKA structures. The proposed YOLO-SDL model provides a new technical solution for agricultural automation and serves as a reliable reference for detecting other crops.