Monochromatic X-ray Spectroscopy Acquires Data on HgTe, Enhancing Future Material Studies.
Monochromatic Al Kα (1486.6 eV) and monochromatic Cr Kα (5414.8 eV) radiation sources were used to acquire x-ray photoelectron spectroscopy (XPS) and hard x-ray photoelectron spectroscopy (HAXPES) data on bulk semimetallic HgTe. The reported spectra include survey scans, high-resolution core-level spectra of Hg and Te, and x-ray-excited Auger transitions. These data provide reference binding and kinetic energy values and are intended to support future XPS and HAXPES studies of HgTe and related materials.
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Mastrippolito et al. (2026) studied this question.
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