Voltage‐Addressable Optical PUFs Based on MoS ₂ Photoluminescence Modulation

Optical physical unclonable functions (PUFs) provide hardware‐level identifiers based on stochastic material disorder, but many reported optical PUFs rely on fixed readout states or require structural reconfiguration to update their responses. Here, we present a lithography‐free, voltage‐addressable optical PUF platform based on multiply stacked exfoliated MoS 2 microstructures. The device combines a static bright‐field grayscale readout with two gate‐dependent photoluminescence (PL) observables, namely PL intensity and PL peak wavelength. The stochastic MoS 2 stacking process produces spatially heterogeneous optical responses, while electrostatic gating enables reversible voltage‐dependent PL readout across 41 measured gate‐voltage states without permanently rewriting the material structure. Correlation and mutual‐information analysis show that the grayscale, PL‐intensity, and PL‐wavelength responses are complementary and partially decorrelated readout channels derived from the same disordered flake network. The generated binary responses exhibit near‐ideal inter‐Hamming‐distance statistics, low empirical bit bias, and low authentication‐error probability, with the aged responses after 10 months still maintaining TAEP below 2 × 10 −36 for PL intensity and 2 × 10 −22 for PL wavelength. These results demonstrate a compact optical PUF architecture that integrates structural disorder and voltage‐addressable PL modulation for multidimensional authentication.