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September 1, 2005Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Physical properties of nanostructures grown by oblique angle deposition

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Authors

JSJ. P. SinghIndian Institute of Technology DelhiTKTansel KarabacakUniversity of Arkansas at Little RockDYD.-X. YeRensselaer Polytechnic Institute

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Singh et al. (2005) studied this question.

synapsesocial.com/papers/6a6641c495ab0834ecfe0f27https://doi.org/10.1116/1.2052747
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