Two algorithms for distributed open-short (OS) and open-short-load de-embedding of multiport on-waferS-parameter measurements are presented, and used for the characterization of four-port differential amplifiers operating in the 60-GHz band. For both methods, comparison to industry standard OS de-embedding shows that anomalies in extracted test-structure parasitics are now avoided, which in particular improves the characterization of the differential input and output impedances.
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Tiemeijer et al. (2011) studied this question.
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