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We have used electron energy-loss spectroscopy to search for differences in the energy-loss near-edge structure of SnO, SnO₂, and an intermediate oxide, with a view to distinguishing them unambigously. We have found that the oxygen K edge exhibits clear differences that can be used for fingerprinting each phase. The oxygen edge appears at the same position for each phase whereas a chemical shift of the Sn M4,5 edge of about 3.50.3em0exeV was observed between phases with Sn in $2+$ and $4+$ oxidation states. Both observations can be used to distinguish between the three phases, allowing their on-line identification within nanostructured materials.
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Moreno et al. (2004) studied this question.
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