The structure of a monolayer silica film on a Mo(112) surface is investigated by grazing scattering of 25 keV H0 atoms. By detection of the number of projectile induced emitted electrons as function of azimuthal angle of rotation of the target surface, the geometrical structure of atoms forming the topmost layer of the silica film is determined via ion beam triangulation. From our data we find evidence for the arrangement of surface atoms in terms of a two-dimensional Si-O-Si network model.
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Seifert et al. (2009) studied this question.
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