An increase of the acceleration voltage in conventional transmission microscopy yields reduced damage to the specimen and a potentially higher resolving power, and permits an increase in specimen thickness. These gains as a function of voltage are discussed and partly confirmed by experiments. The differential gains above 500 kV are very small, yet costly. A range up to 1000 kV for conventional high-voltage electron microscopy can be recommended.
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Bahr et al. (1966) studied this question.
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