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A relatively simple technique has been developed to calibrate particle- and droplet-sizing instruments manufactured by Malvern and other similar Fraunhofer diffraction particle-sizing instruments. Measurements of standard reticles using an instrument calibrated in this manner demonstrate the effectiveness of the procedure. In addition, guidelines are presented to avoid errors due to vignetting of the scattered light signal.
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Lee G. Dodge (1984) studied this question.
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