Properties extracted from force curves obtained by atomic force microscopy (AFM) conducted at various locations on a sample can be mapped to determine their distribution over the sample surface, that is, force curve mapping. Since a huge amount of force curve data must be handled in such mapping, automatic force curve analysis is required. We have developed an algorithm which makes use of a differentiated force curve having peaks at the snap-in and snap-out points of the original force curve and negative values when the AFM tip is in contact with the sample surface. This algorithm was applied to various samples.
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Sugisaki et al. (1998) studied this question.
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