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An experimental setup for the determination of the silicon lattice constant is described. The monolithic flexure hinge mechanisms for orientation adjustment, an optical interferometer for angle and displacement measurement, and a special tool for establishing the parallelism between the optical surface and the reciprocal lattice vector are introduced. The latest experiment gives a value for the ratio of the optical wavelength to the silicon lattice spacing which is consistent with more established values within a currently large uncertainty of one.>
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Tanaka et al. (1989) studied this question.
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