Experimental study demonstrates accelerated degradation modeling in metallic layer resistors, indicating that step-stress testing accurately identifies dominant failure mechanisms.
A model is developed for the relation between the performance degradation of a component in a step-stress test and the stresses applied during the test. Then a methodology is proposed, based on this model, which uses step-stress testing to estimate the parameters of the model that represents the predominant failure mechanism of the component. Experimental results, obtained by testing a lot of metallic layer resistors and applying the Arrhenius model, are reported.
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Iuculano et al. (1986) studied this question.
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