A macromodel for integrated all-MOS operational amplifiers is developed with reference to circuits where the settling behavior of the op amps is of particular concern. Expressions for the values of the elements of the macromodel are obtained from typical measured characteristics. It is shown that the proposed macromodel can satisfactorily predict both small-signal and large-signal behavior of the op amps.
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Turchetti et al. (1983) studied this question.
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