A simple method for the analysis of dislocation loops by means of the inside-outside contrast on transmission electron micrographs

A new method is proposed for the analysis (vacancy or interstital) of dislocation loops by means of the so-called inside-outside contrast. A simple and straightforward recipe is developed which is applicable in the same manner to loops of edge and of non-edge type irrespective of the loop orientation within the transmission foil; in particular, there is no reason for a subdivision of the loop orientations into “safe” and “unsafe” orientations as required when applying the method of Maher and Eyre.