A method of determining the centroid of space in two-side metallized, thin polymer films is discussed. The method is a generalization of the well-known thermal pulse method and allows the determination of the mean depth without knowledge of the sample history. Results for electron-beam charged Teflon FEP films (25 μm thick) are shown and are in good agreement with results obtained for one-side metallized samples by the conventional thermal pulse method. Further agreement is obtained with results, published by Gross et al. [J. Appl. Phys. 48, 563 (1982)], obtained by a different measuring technique. Application of the method is shown by monitoring the charge centroid during a short circuit thermally stimulated discharge experiment.
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Seggern et al. (1984) studied this question.