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April 30, 1985Journal of Physics C Solid State Physics

A model study of field-dependent dynamical screening due to mobile electrons in submicron semiconductor devices

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Authors

DLDavid LoweUniversity of WarwickJBJohn R. BarkerUniversity of Michigan

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Lowe et al. (1985) studied this question.

synapsesocial.com/papers/6a6f3886f44fa9f079dca12ahttps://doi.org/10.1088/0022-3719/18/12/013
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