Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
November 19, 2013IEEE Journal of Emerging and Selected Topics in Power ElectronicsOpen Access

Transitioning to Physics-of-Failure as a Reliability Driver in Power Electronics

View Full Paper
Ask AI
Bookmark
Share

Authors

HWHuai WangShandong UniversityMLMarco LiserreKarlsruhe Institute of Technology
Frede Blaabjerg
Frede BlaabjergUniversity of New Brunswick

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Wang et al. (2013) studied this question.

synapsesocial.com/papers/6a6f397c35aa2c282ce0a001https://doi.org/10.1109/jestpe.2013.2290282
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Reliability, availability and maintainability (RAM) of high power variable speed drive systems (VSDS)2002 · 96 citations
  2. 2Power electronics as efficient interface in dispersed power generation systems2004 · 2,592 citations
  3. 3Prognostics and health management of electronics2006 · 432 citations
  4. 4Assessing the Reliability and Degradation of Photovoltaic Module Performance Parameters2004 · 380 citations