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Electromigration in 525 AA Au films has been studied by transmission electron microscopy during the actual passage of current. The effects of electromigration were the growth of voids near the cathode end and the growth of hillocks near the anode end of the test strip. The hillocks were rounded in shape with heights up to 40* the average thickness of the films. An activation energy of 0.8 eV was calculated from the rate of void growth.
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Bernhard Klein (1973) studied this question.
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