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June 1, 1980Journal of The Electrochemical Society

Spectroscopic Analysis of the Interface Between Si and Its Thermally Grown Oxide

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Authors

DAD. E. AspnesNorfolk State UniversityJTJ. B. TheetenPhilips (France)

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Aspnes et al. (1980) studied this question.

synapsesocial.com/papers/6a6f6666f44fa9f079dcd479https://doi.org/10.1149/1.2129899
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