Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
October 1, 1979Physical Review Letters

Optical Properties of the Interface between Si and Its Thermally Grown Oxide

View Full Paper
Ask AI
Bookmark
Share

Authors

DAD. E. AspnesNorfolk State UniversityJTJ. B. TheetenPhilips (France)

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Aspnes et al. (1979) studied this question.

synapsesocial.com/papers/6a6f6666f44fa9f079dcd47ahttps://doi.org/10.1103/physrevlett.43.1046
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimeters1978 · 123 citations
  2. 2Optical Evidence for a Silicon‐Silicon Oxide Interlayer1979 · 125 citations
  3. 3Auger analysis of ultrathin SiO2 layers on silicon1979 · 84 citations
  4. 4Interspecimen Comparison of the Refractive Index of Fused Silica*,†1965 · 4,242 citations