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June 1, 1969Review of Scientific Instruments

An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation Technique

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SJS. N. JaspersonMassachusetts Institute of TechnologySSS. E. SchnatterlyUniversity of Virginia

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Jasperson et al. (1969) studied this question.

synapsesocial.com/papers/6a6f6666f44fa9f079dcd487https://doi.org/10.1063/1.1684062
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