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Advances millisecond-scale x-ray studies in crystallography; extends prior designs but leaves open routine validation and adoption.
An x-ray area detector has been constructed that has the following capabilities: lower noise and/or higher spatial resolution than previous opto-electronic designs; higher spatial resolution and no significant countrate limitations as compared to multiwire designs; and capability of acquiring millisecond- or microsecond-wide snapshots of a kinetically evolving x-ray pattern. An important feature of the present detector is that all key components are commercially produced; this detector can readily be duplicated in other laboratories.
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Widom et al. (1989) studied this question.
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