Submicrometer-resolution in situ imaging of the focus pattern of a soft x-ray laser by color center formation in LiF crystal

We demonstrate high quality, single-shot in situ imaging of the focused Ag x-ray laser (XRL) at 13.9 nm with 700 nm spatial resolution by color center formation in LiF. The flux and intensity for the color center formation in LiF are evaluated from the experimental data. Comparisons with previous reports show that the threshold x-ray flux for the color center formation in LiF for the 13.9 nm, 7 ps Ag XRL is 3 orders of magnitude less than that with the 46.9 nm, 2 ns capillary discharge Ar XRL.