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July 31, 1980Electronics Letters

Novel method for high resolution measurement of laser output spectrum

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Authors

TOT. OkoshiKeio University Shonan FujisawaKKK. KikuchiTohoku UniversityANA. NakayamaNagoya University

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Implication

Experimental study demonstrates a 50 kHz spectral resolution for semiconductor laser output, indicating a viable method for measuring ultra-narrow linewidths.

Key Points

  • To establish a measurement technique with sufficient spectral resolution to accurately analyze the sharp, narrow linewidths of stabilized semiconductor lasers.
  • Formulated a new optical measurement principle tailored for sub-megahertz spectral line evaluation.
  • Constructed an experimental setup capable of testing laser outputs exceeding the resolution limits of standard spectroscopy.
  • Achieved an experimental spectral resolution of 50 kHz.
  • Successfully demonstrated fine-scale characterization of stabilized semiconductor lasers possessing spectral spreads of several megahertz.

Cite This Study

Okoshi et al. (1980) studied this question.

synapsesocial.com/papers/6a6f73e1e5469ee92be065b1https://doi.org/10.1049/el:19800437
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