For pt.I see ibid., vol.17, p.1433 (1984). This paper is a continuation of the previous (Paper I) to deal with double injection problems in imperfect crystals with non-ohmic contacts. The analysis shows that many unexpected aspects in electric conduction are associated with the interaction between charge carriers and contacts, and that the negative differential resistance regime is associated with the lifetime of the injected minority carriers which is controlled by the occupancy of the recombination centres; and with the carrier injection efficiency which is controlled by the potential barrier at the contacts.
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K. C. Kao (1984) studied this question.
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