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April 1, 1965Journal of Applied Physics

Observations of Individual Dislocations and Oxygen Precipitates in Silicon with a Scanning Electron Beam Method

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WCW. CzajaÉcole PolytechniqueJPJ. R. PatelPohang University of Science and Technology

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Czaja et al. (1965) studied this question.

synapsesocial.com/papers/6a6f77c684cc45bb7bdfa0c9https://doi.org/10.1063/1.1714333
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