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July 1, 1986IEEE Transactions on Magnetics

DC modulation noise in thin metallic media and its application for head efficiency measurements

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Authors

HBH.N. BertramUniversity of California, Los AngelesKHK. HallamasekUniversity of California SystemMMM Martinez MadridStructural Integrity Associates (United States)

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Bertram et al. (1986) studied this question.

synapsesocial.com/papers/6a6f84736ceb2bbd16dfad98https://doi.org/10.1109/tmag.1986.1064314
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