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Heteroepitaxial films of YBa 2 Cu 3 O 7- x /Bi 2 Sr 2 CuO y /YBa 2 Cu 3 O 7- x have been successfully grown using the in situ process. The RHEED pattern of each layer observed in situ showed streaks. The result of cross-sectional transmission electron micrograph (TEM) observation indicates virtually no disruption at the interfaces with the 6 nm-thick intermediate layer. Temperature dependence of resistance through the trilayer also indicates that there is no disruption which would cause short passes for supercurrent between the top and base superconducting layers.
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Harada et al. (1990) studied this question.
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