Experimental study demonstrates accurate dark noise measurement in digital silicon photomultipliers using statistical methods, enabling true photon detection efficiency characterization.
The characterization of nuisance parameters in digital silicon photomultipliers (SiPMs) is important to their understanding and future development. Methods able to distinguish the types of events are necessary to obtain fair and legitimate measurements. In this work, the zero photon probability (ZPP) method and the time delay (TD) method are used to measure the dark noise of digital SiPMs free from the contribution of correlated noise such as afterpulsing and crosstalk. It highlights the unique features of digital SiPMs such as the holdoff delay, the digital output signal, and the embedded processing (e.g. the selection of the interval sampling width). The two methods correctly separate the correlated and uncorrelated events in digital SiPMs and therefore the determination of a true photon detection efficiency (PDE) is possible. The ZPP method is also implemented inside a digital SiPM using embedded digital signal processing.
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Vachon et al. (2020) studied this question.
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