Several paramagnetic defects are photoinduced in amorphous SiO₂ by sub-band-gap light. The resulting EPR spectrum changes dramatically as the excitation energy is varied, and is sensitive to the OH content of the material. A three-component resonance seen in high-OH-content SiO₂ is ascribed to a nitrogen-impurity-related defect.
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Stathis et al. (1984) studied this question.
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