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January 1, 1962Journal of The Electrochemical Society

X-Ray Diffraction Microscopy Study of Imperfections in Silicon Single Crystals

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GSG. H. SchwuttkeArizona State University

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G. H. Schwuttke (1962) studied this question.

synapsesocial.com/papers/6a6fbde3febe604dd70897bbhttps://doi.org/10.1149/1.2425320
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