Impact of Cu/III ratio on the near-surface defects in polycrystalline CuGaSe2 thin films

Polycrystalline CuGaSe2 thin films grown with various Cu/III(=Cu/Ga) ratios were investigated by positron annihilation spectroscopy (PAS). The line-shape parameter S of the spectra was used to characterize defects in CuGaSe2 films. The S-parameter in positron annihilation spectra increased with decreasing bulk Cu/III ratio in the CuGaSe2 film. Experimental results combined with theoretical calculation show the formation of multiple vacancy-type defect complexes in the near-surface region of the CuGaSe2 film when Cu-content in the film is decreased. These point defects appear to cause the higher S-parameter in PAS measurement.