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Half-plane apertures in transmission electron microscopy (TEM) and split detectors in scanning transmission electron microscopy (STEM) can provide useful information about the phase and amplitude components of the specimen transparency. A procedure involving structured incident illumination (psychography) in TEM has so far proved difficult to apply in practice. The STEM arrangement and a generalization of it are discussed in some detail and some STEM analogues of psychography are proposed.
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Peter Hawkes (1978) studied this question.
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