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Analytical and experimental considerations on the surge and noise generated in a typical switching regulator are discussed. There are two kinds of surges which occur in the switching instants of the transistor. These surges appear as high voltages across the semiconductor elements and decrease their reliabilities. Corresponding to the surge generation, noise voltages appear in the output terminals and may induce malfunctions of a signal processing device connected to the regulator. We analyze these surge and noise voltages by means of high-frequency equivalent circuits.
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Harada et al. (1978) studied this question.
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